Averaged Steklov Eigenvalues, Inside Outside Duality and Application to Inverse Scattering
Résumé
We introduce a new family of artificial backgrounds corresponding to averaged impedance boundary conditions formulated in an abstract framework. These backgrounds are used to define a finite number of averaged Steklov eigenvalues, which are associated with inverse scattering problems from inhomogeneous media. We prove that these special eigenvalues can be determined from full-aperture, fixed-frequency far-fields using the inside-outside duality method. We then show and numerically demonstrate how this method can be used to reconstruct averaged values of the refractive index.
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